ALD Systems

ALD Systems

Navigation Bar
Tabbed Content with Akzidenz Grotesk

ALD System Overview

As the semiconductor technology advances, the demand for atomically thin, high-performance materials continues to grow. Our single-chamber Atomic Layer Deposition (ALD) and High-Temperature Annealing system is engineered for up to 8” wafer processing, delivering precise layer growth, defect elimination, and enhanced crystallinity & uniformity—all in one integrated platform.

Integrated Platform
  1. Shower Head gas inlet with single gas input with heated line.
  2. SiC³ coated graphite sample holding for 6” or 8” wafers.
  3. Gas cooling ring.
  4. Sample lifting mechanism.
  5. SiC³ coated graphite heating element.
  6. 2 x Type K Thermocouples monitoring element temperature.
  7. 1 x K type thermocouple monitoring wafer temperature.

Step 1: Atomic Layer Deposition (ALD) – Controlled Growth at the Atomic Scale


Our ALD process enables precise, self-limiting deposition of 2D materials like MoS₂, MoO₃, WS₂, and Wo₃ for next-generation transistors, sensors, and flexible electronics.

  • Scalable for up to 8” Wafers – Enables uniform deposition over large-area substrates.
  • Superior Step Coverage – Achieves monolayer precision on high-aspect-ratio structures.
  • Low-Temperature Processing – Ensures compatibility with advanced semiconductor materials.
  • Showerhead gas delivery system – allowing for uniform gas distribution.

Step 2: High-Temperature Annealing (Up to 1200°C) – Enhanced Material Properties


Post-deposition annealing optimises film quality and electronic performance using precise gas-controlled environments and sample lifting technology for fast cooling.

  • High Temperatures (Up to 1200°C) – Promotes crystallinity and phase transformation.
  • Reactive & Inert Gas Processing – H₂S, H₂Se, O₂, O₃, N₂, and Ar.
  • Wafer Gas Cooling & Sample Lifting – Ensures uniform thermal management and rapid cooldown for process stability.

Why Semiconductor Manufacturers Choose Our Solution


  • Single-Chamber ALD & Annealing – Reduces contamination risks and improves efficiency.
  • High-Temperature Annealing – Up to 1250°C for optimised 2D material properties.
  • Multi-Gas Compatibility – Enables oxide, sulfide, and nitride processing in a controlled environment.
  • Wafer-Scale Processing – Supports up to 8” wafers for high-volume semiconductor fabrication.
  • Advanced Cooling & Handling – Sample lifting & wafer gas cooling for precise temperature control.


Our ALD System is designed to accelerate 2D material integration into next-generation semiconductor devices, including high-mobility transistors, memory, and optoelectronics.


Power the future of semiconductor technology—partner with Thermic Edge Ltd for cutting-edge 2D material processing.

Technical Specifications

Parameter Specification
Temperature 1200℃ max substrate temperature
Footprint of the frame x 2 frame (two separate frames per system) 600mm width x 650mm depth x 1400mm height (free standing pump)
Vacuum level ATM to 1x10⁻² mbar base pressure
Sample size 150mm (6”) / 200mm (8”)
Substrate holder material SiC³ Coated Graphite (link to Coatings page)
Chamber Full water-cooled 316SS
Vacuum pump Chemical Resistant Screw pump
Controls Eurotherm / Mitsubishi PLC
Compatibility O₂, H₂S,
Purge Gas N₂ and Ar
Precursor Delivery system 2 heated lines heated to 150℃. Fast Acting ALD Valves and MFC’s
Power 400V Three Phase
Substrate Heating SiC³ Coated Graphite
Thermocouples x3 (one on substrate)
Heater uniformity less than 2%
Ramp Rate 100℃/min
Cleanroom capability Cleanroom 100

Request a Quote

ALD System Overview

As the semiconductor technology advances, the demand for atomically thin, high-performance materials continues to grow. Our single-chamber Atomic Layer Deposition (ALD) and High-Temperature Annealing system is engineered for up to 8” wafer processing, delivering precise layer growth, defect elimination, and enhanced crystallinity & uniformity—all in one integrated platform.

Subtitle
  1. Shower Head gas inlet with single gas input with heated line.
  2. SiC³ coated graphite sample holding for 6” or 8” wafers.
  3. Gas cooling ring.
  4. SiC³ coated graphite heating element.
  5. Sample lifting mechanism.
  6. 2 x Type K Thermocouples monitoring element temperature.
  7. 1 x K type thermocouple monitoring wafer temperature.

Integrated ALD & Advanced Annealing for High-Purity 2D Materials

Step 1: Atomic Layer Deposition (ALD) – Controlled Growth at the Atomic Scale

Our ALD process enables precise, self-limiting deposition of 2D materials like MoS₂, MoO₃, WS₂, and Wo₃ for next-generation transistors, sensors, and flexible electronics.

  • Scalable for up to 8” Wafers – Enables uniform deposition over large-area substrates.
  • Superior Step Coverage – Achieves monolayer precision on high-aspect-ratio structures.
  • Low-Temperature Processing – Ensures compatibility with advanced semiconductor materials.
  • Showerhead gas delivery system – allowing for uniform gas distribution.
 

Step 2: High-Temperature Annealing (Up to 1200°C) – Enhanced Material Properties

Post-deposition annealing optimises film quality and electronic performance using precise gas-controlled environments and sample lifting technology for fast cooling.

  • High Temperatures (Up to 1200°C) – Promotes crystallinity and phase transformation.
  • Reactive & Inert Gas Processing – H₂S, H₂Se, O₂, O₃, N₂, and Ar.
  • Wafer Gas Cooling & Sample Lifting – Ensures uniform thermal management and rapid cooldown for process stability.
 

Why Semiconductor Manufacturers Choose Our Solution

Single-Chamber ALD & Annealing – Reduces contamination risks and improves efficiency.

High-Temperature Annealing – Up to 1250°C for optimised 2D material properties.

Multi-Gas Compatibility – Enables oxide, sulfide, and nitride processing in a controlled environment.

Wafer-Scale ProcessingSupports up to 8” wafers for high-volume semiconductor fabrication.

Advanced Cooling & HandlingSample lifting & wafer gas cooling for precise temperature control.

Our ALD System is designed to accelerate 2D material integration into next-generation semiconductor devices, including high-mobility transistors, memory, and optoelectronics.

Power the future of semiconductor technology—partner with Thermic Edge Ltd for cutting-edge 2D material processing.

ALD Systems Image
ALD System Second Close Up
ALD Systems close up

Request a Quote

Technical Specifications

Temperature 1200℃ max substrate temperature
Footprint of the frame x 2 frame (two separate frames per system) 600mm width x 650mm depth x 1400mm height (free standing pump).
Vacuum level ATM to 1×10-2mbar base pressure
Sample size 150mm (6”) 200mm (8”)
Substrate holder material SiC3 Coated Graphite
Chamber Full water-cooled 316SS
Vacuum pump Chemical Resistant Screw pump
Controls Eurotherm / Mitsubishi PLC
Compatibility O2, H2S,
Purge Gas N2 and Ar
Precursor Delivery system 2 heated lines heated to 150℃. Fast Acting ALD Valves and MFC’s
Power 400V Three Phase
Substrate Heating SiC3 Coated Graphite.
Thermocouples x3 (one on substrate)
Heater uniformity less than 2%.
Ramp Rate 100℃/min.
Cleanroom capability Cleanroom 100

Request a Quote

Image Gallery

ALD Systems Image
ALD System Second Close Up
ALD Systems close up